| Commit message (Collapse) | Author | Age | |
|---|---|---|---|
| * | ddf-sudden-degraded test fix. | NeilBrown | 2014-03-26 |
| | | | | | | | | Change how sudden-degraded devices should appear. We don't record failure, we record that the device isn't there. Signed-off-by: NeilBrown <neilb@suse.de> | ||
| * | tests: add test that DDF marks missing devices as failed on assembly. | NeilBrown | 2014-03-11 |
| If we assemble a newly-degraded array, the missing devices must be marked as 'failed' so we don't expect them in future. Signed-off-by: NeilBrown <neilb@suse.de> | |||
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